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UMC Adopts Synopsys IC Validator for Pattern Matching-Based Lithography Hot-Spot Verification at 28 nm

February 8, 2013 by admin · Leave a Comment
Filed under: Design and Reuse 

UMC Adopts Synopsys IC Validator for Pattern Matching-Based Lithography Hot-Spot Verification at 28 nm
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Tags: IC Validator, full article

Tags: full article, IC Validator

UMC Qualifies Synopsys’ IC Validator for 28-nm Physical Verification

October 23, 2012 by admin · Leave a Comment
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UMC Qualifies Synopsys’ IC Validator for 28-nm Physical Verification
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Tags: full article, IC Validator, UMC Qualifies Synopsys

Tags: full article, IC Validator, UMC Qualifies Synopsys

Synopsys’ IC Validator Certified by GLOBALFOUNDRIES for 28-nm, 40-nm and 65-nm Design

December 9, 2011 by admin · Leave a Comment
Filed under: Design and Reuse 

Synopsys’ IC Validator Certified by GLOBALFOUNDRIES for 28-nm, 40-nm and 65-nm Design
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Tags: IC Validator

Tags: IC Validator

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